| 论文编号: | |
| 第一作者所在部门: | |
| 论文题目: | Self-healing behaviors of metallized high-temperature dielectric films for capacitor applications |
| 论文题目英文: | |
| 作者: | Jiafeng Zhu, Hui Tong*, Shimo Cao, Jinpeng Luo, Xuepeng Liu, Ju Xu, Moliar Oleksandr, Wenfei Peng* |
| 论文出处: | |
| 刊物名称: | Microelectronics Reliability |
| 年: | 2023 |
| 卷: | |
| 期: | |
| 页: | |
| 联系作者: | |
| 收录类别: | |
| 影响因子: | |
| 摘要: | |
| 英文摘要: | |
| 外单位作者单位: | |
| 备注: | |
Self-healing behaviors of metallized high-temperature dielectric films for capacitor applications