Developing an accelerated life test method for LED source and failure analysis
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论文题目: Developing an accelerated life test method for LED source and failure analysis
论文题目英文:
作者: Chen Gong;Haiping Xu;Jinhua Liang;Zengquan Yuan;Xi Chen;Haoyan Li
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刊物名称: AOPC 2022: Optoelectronics and Nanophotonics
: 2023
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