| 论文编号: | |
| 第一作者所在部门: | |
| 论文题目: | Improvement of the Square Root t Method for Junction Temperature Measurement of SiC MOSFET Power Cycling Test |
| 论文题目英文: | |
| 作者: | Hao Jin, Jin Zhang, Xiaofeng Jiang |
| 论文出处: | |
| 刊物名称: | The 2nd IEEE International Power Electronics and Application Conference and Symposium（ PEAS 2023）,Guangzhou, China |
| 年: | 2023 |
| 卷: | |
| 期: | |
| 页: | |
| 联系作者: | |
| 收录类别: | |
| 影响因子: | |
| 摘要: | |
| 英文摘要: | |
| 外单位作者单位: | |
| 备注: | |
Improvement of the Square Root t Method for
Junction Temperature Measurement of SiC
MOSFET Power Cycling Test