| 论文编号: | 0 |
| 第一作者所在部门: | 0 |
| 论文题目: | Research on Switching Losses Testing Method for SiC MOSFET SiC MOSFET开关损耗测试方法研究 |
| 论文题目英文: | |
| 作者: | Zheng, Dan; Zhang, Shaokun; Li, Lei; Cao, Han; Fan, Tao; Ning, Puqi; Zhang, Jin; Wen, Xuhui 郑丹;张少昆;李磊;曹瀚;范涛;宁圃奇;张瑾;温旭辉 |
| 论文出处: | 0 |
| 刊物名称: | Zhongguo Dianji Gongcheng Xuebao/Proceedings of the Chinese Society of Electrical Engineering 中国电机工程学报 |
| 年: | 2020 |
| 卷: | 0 |
| 期: | 0 |
| 页: | 0 |
| 联系作者: | 0 |
| 收录类别: | |
| 影响因子: | 0 |
| 摘要: | 0 |
| 英文摘要: | |
| 外单位作者单位: | 0 |
| 备注: | 0 |
Research on Switching Losses Testing Method for SiC MOSFET
SiC MOSFET开关损耗测试方法研究