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| 论文题目: | Online Monitoring of SiC MOSFET Junction Temperature with Full-range and Gate oxide Defect Insensitivity |
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| 作者: | 郑丹，温旭辉，仇志杰，李鸿扬，欧阳文远，蒋潇锋，宁圃奇，范涛 |
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| 刊物名称: | PCIM Asia Shanghai Conference 2025 24.09.2025 - 26.09.2025, China |
| 年: | 2025 |
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Online Monitoring of SiC MOSFET Junction Temperature with Full-range and Gate oxide Defect Insensitivity